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AFM Characterization of Patterned Sapphire Substrates (PSS) with Nanometers to Micron sized Spikes:
【机 构】
:
School of Chemical Engineering and Chemsitry, Harbin Institute of Technology, 92 West Dazhi Street,
【出 处】
:
第十一届中美华人纳米论坛
【发表日期】
:
2016年5期
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