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The research of Au films' thickness on their electrical resistivity by atomic force microscopy
【作 者】
:
【机 构】
:
State Key laboratory of Electroanalytical Chemistry,Changchun Institute of Applied Chemistry,Changch
【出 处】
:
第十五届国际电分析化学国际会议(The Fifteenth International Symposium on Ele
【发表日期】
:
2015年期
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