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在对电子产品可靠性技术的最新发展趋势进行了展望之后， 对多芯片系统的可靠性技术作了较全面的评述。对研究多芯片系统可靠性的失效率预测方法和失效物理评价方法以及多芯片系统的关键技术问题着重进行了细致的剖析并提出了解决的思路
After making a prospect of the latest development trend of electronic product reliability technology, the reliability technology of multi-chip system was comprehensively reviewed. The research on the failure rate prediction method and failure physics evaluation method of multi-chip system reliability and the key technical problems of multi-chip system are analyzed in detail and the solutions are proposed