Atomic Force Microscopes (AFMs) have been widely used for scanning measurement at micron and nano scales.A micro-cantilever with a sharp probe at its free end is a key component of an AFM.It works in a similar way to a gramophone stylus.While the probe scans the surface of a sample, the contact force between the probe tip and the sample surface leads to a small elastic deflection of the micro-cantilever: The deflection is measured by reflecting a laser beam on the top surface of the cantilever to a position-sensitive photodetector which records the movement of the reflected laser beam.By converting the signal generated, a topographic image of the samples surface is generated.