论文部分内容阅读
The amorphous silicon (a-Si) thin films were deposited by PECVD and then were annealed by RTP.Using the Fourier infrared conversion spectrum scanning, electronic microscope and X-ray-diffraction techniques, the properties of annealed a-Si thin film were analyzed.It was found that the hydrogen of thin films vanished completely when annealed at 600℃ for 60s.The results showed the surface of thin films became smoother with multi-step annealing than one step annealing.The results suggest that the multi-step annealing can improve the surface quality and crystallinity of thin films.