SUNIST欧姆放电等离子体小破裂过程中由逃逸电子驱动的TAE

来源 :中国物理学会2015年秋季会议 | 被引量 : 0次 | 上传用户:cabinwyq
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  在SUNIST球形托卡马克(ST)欧姆放电等离子体小破裂过程中首次发现了由逃逸电子驱动的环形阿尔芬本征模(TAE)。在小破裂先兆前期,m/n = -3/-1的MHD模式会快速增长,直至先兆后期出现锁模并最终导致小破裂。大量实验观测结果表明,小破裂过程常常会伴随出现逃逸电流平台和高频MHD扰动。
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