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Nowadays,magneto-optical ultrathin films have been widely used in the disk read-write area and spinning electron devices.The development and implementation of spintronic devices require detailed information on the kinetic,relaxation and transport properties of spin subsystems.Generalized magneto-optical ellipsometry (GME) is a new kind of accurate detecting technique which can be used to measure the magneto-optical response of ultra-thin films.GME combines traditional ellipsometry (TE) technique and magneto-optical Kerr effects (MOKE)[1].