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Atomic Force Microscope(AFM)obtains high resolution morphology of various samples,from live cells to minerals,from quantum dots to oxide thin films.When moving beyond simple topography,AFM is also a powerful platform for characterisation of various materials properties,including electrical,mechanical,magnetic and thermal,etc.Many advanced AFM modes,such as PFQNM,PFTUNA,PFKPFM and PFPFM,are based on the latest "PeakForce Tapping" technology.These modes enable the in-situ correlation of topography,mechanical(including Youngs Modulus,adhesion force,and deformation),conductivity/surface potential/ferroelectric domain structure of samples because these properties are mapped simultaneously with enhanced resolution.In this presentation,recent advances in AFM technologies will be introduced,with their application examples in different research fields.