We make use of the distance dependence of the electrospray process to realize a new form of scanning probe microscopy,which we describe here as scanning electrospray microscopy(SESM).SESM employs a small pipet,similar to that used for scanning ion conductance microscopy(SICM)or some modes of scanning electrochemical microscopy(SECM),as a scanning electrode.Electrospray is generated by application of a suitable potential to an electrolyte solution inside of the pipet,and the magnitude of electrospray current is used for control of the probe?surface distance.Approach curves have experimentally demonstrated the relationship between electrospray current and distance between the probe and substrate.Approach-retract scanning mode was utilized to generate an image of both insulative and conductive topographical features.We expect that SESM may find future application in micro/nano patterning and materials synthesis by electrospinning/electrospray deposition.SESM as an imaging method also opens up possibilities for collection of concomitant ambient mass spectrometry imaging(MSI)and topographical information.SESM may also be suited for integration with MS in a desorption electrospray ionization(DESI)mass spectrometry imaging format,although additional experimental considerations(e.g.,nebulizing gas)are required.SESM holds promise to add dynamic probe-surface distance control and topographic imaging to MSI.We are presently exploring the fundamentals of SESM as an electrochemical imaging platform further,as well as new routes to materials deposition and MSI applications of SESM.