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5. The Oxide Layer on Tantalum Metal - a Model System for the Investigation of Dielectric Behavior and

The Oxide Layer on Tantalum Metal - a Model System for the Investigation of Dielectric Behavior and

来源 :The 60th Annual Meeting of The International Society of Elec | 被引量 : 0次 | 上传用户：mm963258

【作 者】

：

C.A.Schiller P.Schmuki 

【机 构】

：

ZAHNER-elektrik,Thüringerstr,12,D-96317 Kronach,Germany

【出 处】

：

The 60th Annual Meeting of The International Society of Elec

【发表日期】

：

2009年8期

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