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In this paper we measured the re-combination of each domain, concluding emitter region, bulk region and back surface field (BSF) region, of industrial aluminum back surface field (Al-BSF) solar cell by means of quasi-steady-state photo-conductance (QSSPC) method with Sinton WCT-120.First we measured the optical constant for each QSSPC measurement sample.For the emitter samples with surface texture and anti-reflection layer exhibiting outstanding light trapping performance have an optical constant over 1.1.On the contrary the optical constant of BSF samples with bare and relatively smooth surface is only 0.71.With these determined optical constant samplesaturated current density (J0) is then precisely measured.Emitter J0(J0,e) ranges from 72 to 302 fA/cm2.For BSF J0 (J0,BSF), when the BSF thickness is about 6 um the J0,BSF achieved a relatively low value of 310fA/cm2.The Bulk lifetime of industrial mono-crystalline silicon (c-Si) wafer is about 430 us when multicrystalline silicon (mc-Si) is about 200 us.