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关于材料表面发射率的测量，已作了大量的研究工作，而材料表面在不同温度下的连续光谱发射率的测量，一直是一个难点。介绍了利用傅里叶红外光谱仪、微型黑体、微型试样加热器和辅助光路组成的测量装置，成功地实现了固体材料表面连续光谱发射率的测量。
A great deal of research work has been done on the measurement of the surface emissivity of materials. The continuous spectral emissivity measurement of material surfaces at different temperatures has been a difficult task. The measuring device composed of Fourier infrared spectrometer, miniature blackbody, miniature sample heater and auxiliary light path is introduced, and the continuous spectral emissivity measurement on the surface of solid material is successfully achieved.