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会聚束电子衍射(CBED)对晶体缺陷的研究分析方法尚处在尝试阶段。本文应用CBED对纯Al中的小角度晶界、亚晶界进行了定量研究。旨在介绍应用该技术对晶界两侧晶体的取向差精确测定的一种新方法。定量计算结果:小角度晶界的取向差为1.55°± 0.051°,亚晶界的取向差为0.32°±0.037°。并且对由位错引起的错向角进
Convergence beam electron diffraction (CBED) on the crystal defect research and analysis methods is still in the trial stage. In this paper, CBED was used to quantitatively study the small-angle grain boundaries and subgrain boundaries in pure Al. The purpose of this paper is to introduce a new method of accurate determination of the orientation difference of the crystal on both sides of the grain boundary by using this technique. Quantitative calculation results show that the orientation difference between the small-angle grain boundaries is 1.55 ° ± 0.051 ° and the orientation difference between the sub-grain boundaries is 0.32 ° ± 0.037 °. And the wrong angle caused by the dislocations into