Test of Potential Induced Degradation (PID) on Solar Cell Level

来源 :SNEC 第九届(2015)国际太阳能产业及光伏工程(上海)论坛 | 被引量 : 0次 | 上传用户:archer007
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  During the last years several PID based module degradations have been reported for existing solar parks.This has caused intensive research activities worldwide to avoid this kind of power losses.Technology approaches to avoid PID are either focused on the system design, the module materials (especially encapuslant) or SiN optimization on the cell level.A new IEC recommendation (IEC 62804) has been developed in the last two years to test the susceptibility of full solar modules.
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