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Despite the enormous success and wide application of Atomic Force Microscope (AFM) in various areas,many researchers have still been conservative about the capability of AFM to achieve atomic and molecular resolution in ambient conditions.This scenario was formed,historically,due to numerous inappropriate declarations of obtaining so-called atomic and molecular resolution AFM images.In the last 15 years,reports of true atomic and molecular resolution in ambient conditions were by no means scarce; nevertheless,some have been overlooked and are rarely known,even to an AFM specialist! The AFM community could hardly benefit from this overlook because an AFM user,trained with this biased philosophy,might be frustrated and regard the challenge of achieving trustworthy high resolution as an impossible task.Instead,one needs to appreciate the power of AFM as an atomic and molecular scale analytical technique that is capable of producing reliable and reproducible topographs with various operation modes; at the same time,one needs to learn that AFM,as a local probe technique,is particularly vulnerable to artifacts.An experienced AFM user should be able to identify artifacts,avoid artifacts,and live skeptically with artifacts if necessary.This presentation,based on my recent Surf.Sci.Rep.review [1],will review critically and timely the achievements of atomic and subnanometer resolution in non-UHV conditions by AFM.The concept of resolution is discussed,then the important issues of reproducibility and artifacts are discussed in depth,with some examples taken from the latest literature.