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中子反射是一种研究表面和界面微观结构的新技术。极化中子反射已广泛应用于研究磁薄膜、磁超晶格等的微观磁结构,提供样品中核和磁散射长度密度分布信息,在表面化学、固体薄膜、表面磁学等方面的研究中起到了X射线反射等其它实验手段无法替代的重要作用。磁多层膜实验样品由首都师范大学制备,采用磁控溅射方法在60mm×25mm玻璃衬底上交替镀20层的Ni和Co。在镀膜过程中,施加外磁场以控制内禀磁矩的取向。极化中子反射实验测量在德国HMI的水平散射几何反射仪V14上进行,入射中子波长为0.475nm,准直狭缝宽度为1mm,准直狭缝间距离为1m,实验中所用样品为25mm×25mm。实验施加的外磁场
Neutron reflections are a new technique for studying the microstructure of surfaces and interfaces. Polarized neutron reflection has been widely used to study the microscopic magnetic structures of magnetic thin films, magnetic superlattices and the like, and provides information on the length and density distributions of nuclei and magnetic scattering in samples. In studies on surface chemistry, solid films, surface magnetics and the like To X-ray reflection and other experimental means irreplaceable important role. Magnetic multi-layer film samples were prepared by the Capital Normal University, using magnetron sputtering method on a 60mm × 25mm glass substrate alternately plated 20 layers of Ni and Co. During the coating process, an external magnetic field is applied to control the orientation of the intrinsic magnetic moment. Polarization neutron reflection experiment measured in the German HMI horizontal scattering geometry reflectometer V14, the incident neutron wavelength of 0.475nm, collimation slit width of 1mm, alignment slit spacing of 1m, the experiment used in the sample 25mm × 25mm. Experimental applied external magnetic field