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采用多元硅漂移探测器(Silicon Drift Detector,SDD)阵列和快速处理电子学系统在EAST托卡马克上构建了一套性能优异的软X射线能谱诊断系统,用于测量等离子体内在软X射线能段(1-30 keV)的辐射能谱。本系统观测范围覆盖了EAST等离子体的下半空间,可在EAST上各种放电条件下获得电子温度分布。本系统具有较高的能量分辨率,可用于监测等离子体内的中高Z杂质。系统安装在EAST上并投入使用,验证了系统的可靠性和有效性并取得良好的实验结果。
A high-performance soft X-ray spectroscopy diagnostic system was constructed on the EAST tokamak using a Silicon Drift Detector (SDD) array and a rapid processing electronics system to measure the intensity of the soft X-ray Energy spectrum (1-30 keV). The scope of this system covers the lower half of the EAST plasma and allows electron temperature distribution under various discharge conditions on EAST. The system has a high energy resolution, can be used to monitor the plasma in the high-Z impurities. The system was installed and put into use on EAST, which verified the reliability and effectiveness of the system and achieved good experimental results.