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针对电子产品在贮存过程中受到的复杂环境应力及现阶段主要采用单应力加速贮存试验的现状,提出一种基于累积损伤理论的温度-湿度步降加速贮存试验方案的优化设计方法。以电子设备正常应力水平下中位寿命估计值的最小渐近方差为目标,以各加速应力水平为设计变量,结合极大似然估计理论,建立了温度-湿度综合应力加速贮存试验方案优化设计的数学模型。对某电度表的综合应力加速贮存试验进行优化设计,利用遗传算法解得k=5时的方案为最优方案。利用Monte Carlo仿真进一步证明k=5时的方案为最优方案。经优化后的试验方案不仅可以满足小样本综合应力加速贮存试验的优化设计,而且能够保证试验数据的估计精度,减少试验次数,缩短试验时间和节约费用。
Aiming at the complex environmental stress that electronic products are subjected to during storage and the current situation that single-stress accelerated storage test is mainly used, an optimization design method of temperature-humidity step-down storage test scheme based on cumulative damage theory is proposed. Taking the minimum asymptotic variance of the median life expectancy at the normal stress level of the electronic device as the target and the acceleration stress level as the design variable, combined with the maximum likelihood estimation theory, a temperature-humidity integrated stress accelerated storage test scheme optimization design Mathematical model. Optimized design of the comprehensive stress accelerated storage test of a watt-hour meter, using the genetic algorithm to obtain the optimal solution when k = 5. The Monte Carlo simulation further proves that the scheme with k = 5 is the optimal scheme. The optimized experimental scheme can not only satisfy the optimal design of the accelerated stress storage test, but also guarantee the accuracy of the test data, reduce the test times, shorten the test time and save the cost.