通过试验获得了充电电容对半导体桥(SCB)放电过程中SCB两端的电压以及流过SCB的电流,利用分段计算电阻值变化方法,得到了SCB的温度与电阻的关系,然后运用该关系模拟了SCB的电压——时间和电流——时间的关系曲线。该模拟方法主要从SCB电爆特性的物理意义出发,无需大量的数学束缚条件,且得到的模拟数值与试验结果基本一致。 The voltage across the SCB and the current flowing through the SCB during the discharge of the SCB by the charging capacitor are obtained through experiments. The relationship between the temperature and the resistance of the SCB is obtained by using the method of calculating the resistance value by the section. Then the relationship is simulated SCB voltage - time and current - time curve. The simulation method is mainly based on the physical meaning of SCB electric explosion characteristics, without a lot of mathematical constraints, and the simulation results are basically consistent with the experimental results.