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本文讨论了折线法近似对数特性的一般原理,给出了理论误差和单级放大器工作动态的相对关系,并据据实际电路模型作了误差分析与估计。放大器和检波器的饱和特性改善了近似关系,而放大器备级增益和饱和电平在工作频带内的不一致性又使近似变差。在常温下做了实验,结果表明:在一定的增粉差范围内,由于放,大器增益的起伏和检波器失配的影响引起的对数特性变差与检波器和放大器特性对近似关系的改善量相当,所以要使对数精度满足使用要求,实际单级放大器的标称增益 Go 可按理想折线法结果选取。
This paper discusses the general principle of the approximate logarithmic characteristic of the polyline method, gives the relative relationship between the theoretical error and the working dynamics of the single-stage amplifier, and makes error analysis and estimation based on the actual circuit model. The saturation characteristics of the amplifier and the detector improve the approximation, and the inconsistency of the amplifier’s standby gain and saturation level in the operating band again causes the approximate deterioration. Experiments were conducted at room temperature. The results show that the variation of logarithmic characteristics due to the effects of amplification, amplifier gain mismatch and detector mismatch within a certain range of additive powder pitch is related to the approximate relationship between detector and amplifier characteristics Of the amount of improvement, so to make the logarithmic accuracy to meet the use requirements, the actual single-stage amplifier nominal gain Go can be selected by the ideal line method results.