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本文叙述了HL-1装置的X射线测量。结果表明,电子温度随着等离子体电流通道的缩小而升高,其典型值为480eV。稳定放电的软X射线扰动幅度大约是总强度的15％,锯齿振荡周期约为2ms。与磁探针信号比较,明显看到了内、外模之间的耦合关系。多次放电清洗了真空空器壁,含水量下降;硬X射线测量表明,逃逸产生率减小。
This article describes the X-ray measurement of the HL-1 device. The results show that the electron temperature increases with the decrease of the plasma current path, and its typical value is 480eV. Stable discharge of soft X-ray disturbance amplitude is about 15% of the total intensity, sawtooth oscillation period of about 2ms. Compared with the magnetic probe signal, obviously saw the coupling relationship between the inner and outer mold. Multiple discharges clean the vacuum vessel wall, water content decreased; hard X-ray measurements show that the escape rate is reduced.