温度循环筛选是提高产品可靠性的重要手段之一,而光电试验舱内温度循环引发的呼吸作用可能是导致光电产品结雾的原因。文章详细分析了某光电舱温度循环时低温结雾的现象,通过理论计算和相关试验,表明器件内部水汽含量过大是此现象出现的主要原因,而密封结构的呼吸作用影响较小。根据以上结果,提出了相关解决措施。 Temperature cycling screening is one of the important means to improve the reliability of products. The respiration induced by temperature cycling in the photoelectric test chamber may be the cause of the fogging of optoelectronic products. In this paper, the phenomenon of low temperature fogging in a photovoltaic cell temperature cycle is analyzed in detail. Theoretical calculations and correlation tests show that the internal water vapor content of the photovoltaic device is the main cause of this phenomenon, while the breathing effect of the seal structure is small. Based on the above results, the relevant solutions are proposed.