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大规模集成电路工艺技术的发展,越来越使人们感到借助计算机参予设计和研制的迫切性。其目标就是要借助计算机在研制的过程中达到自动化或半自动化的目的。就大规模集成电路而言,其测试项目繁多,单靠人工操作已无法胜任。而借助于高级测试语言来编写测试的程序,由计算机来完成,则要简单而可靠得多。下面我们就从一个实例开始,以后再转入具体的计算机辅助测试技术中去。在计算机中常用到“与或非”电路,其形式如图1所示。
The development of large scale integrated circuit technology has increasingly made people feel the urgency of using computers to design and develop. Its goal is to use the computer in the development process to achieve the purpose of automation or semi-automation. For large-scale integrated circuits, the test project is numerous and can not be performed manually. With the help of advanced test language to write test programs, done by the computer, it is much simpler and much more reliable. Below we start from an example, and later into the specific computer-aided testing technology. Commonly used in computers to “or and” circuit, the form shown in Figure 1.