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在反应堆孔道中,同时辐照标准和比较器,所测γ射线的比计数率之比,经重新排列活化公式之后可以写成(1) 式中:A_(SP)为比计数;ε_P为效率;f=φ_(th)/φ_(?)(φ_(th)为热中子流量,φ_(?)为超热中子流量);Q=I_0/σ_0(I_0为无限稀释共振积分截面,σ_0为中子速度2200m/s的中子截面)。 1.实验方法 (1) 提高标准精度 在测定K_0值时,采用单晶硅片衬底标准,其标准精度一般可达5％左右。 (2) 相对效率曲线测定 采用~(75)Se、~(82)Br、~(110m)Ag、~(152)Eu、~(182)Ta和~(140)La对Ge(Li)探测器表面效率进
In the reactor channel, while irradiating the standard and the comparator, the ratio of the measured gamma rays to the count rate can be written as (1) after rearrangement of the activation formula: A_ (SP) is the specific count, ε_P is the efficiency, Q = I_0 / σ_0 (I_0 is the infinitely-diluted resonance integral cross-section, σ_0 is Neutron velocity of 2200m / s neutron cross section). 1. Experimental methods (1) to improve the standard accuracy K_0 value in the determination, the use of single crystal silicon substrate standards, the standard accuracy of up to about 5%. (2) The relative efficiency curve was determined using Ge (Li) detector with ~ (75) Se, ~ (82) Br, ~ (110m) Ag, ~ (152) Eu, ~ (182) Ta and ~ (140) La Surface efficiency into