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CMOS集成电路中的冒险现象会增大电路的功耗,所以对集成电路中冒险的检测和消除的研究十分重要。文章分别对集成电路中原始输入单跳变,和多跳变两种情况下产生的冒险现象进行了研究,提出了检测和消除冒险的方法。文章的方法可以在非常短的时间内检测出电路中可能产生冒险的点,对于单个原始输入跳变的情况可以通过增加很少的电路开销来消除一部分冒险点。
The risky phenomenon in CMOS integrated circuits will increase the power consumption of circuits, so it is very important to study the detection and elimination of risks in integrated circuits. This paper studies the adventures of ICs in single input transitions and multi-jumps respectively, and puts forward the methods of detecting and eliminating adventures. The article’s approach can detect potentially adventitious points in a circuit in a very short period of time, eliminating some of the risk points for a single raw input transition by adding little overhead.