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工业X射线照相中,探伤人员可根据曝光曲线迅速、准确地找到被检件在某一厚度能满足底片指定黑度的管电压和曝光量。但常规曝光曲线是在一定焦距条件下制作的,而在实际工作中,常因条件制约或不同需要,实用焦距需随机变化。在大量变焦距透照时,一般采用现场试拍片或修正曝光量的方法来寻求合适的曝光参数,这不仅给现场透照工作带来不便,且低效浪费。
In industrial X-ray photography, the inspectors can quickly and accurately find the tube voltage and the exposure amount of the tested piece at a certain thickness that meets the designated blackness of the film according to the exposure curve. However, the conventional exposure curve is made under certain focal length conditions, and in practical work, often due to conditions or different needs, the practical focal length should be randomly changed. In the case of a large number of zoom transillumination, it is generally sought to find suitable exposure parameters by means of field test or correction of exposure, which not only brings inconvenience to the site transillumination work but also is inefficient and wasteful.