采用微波消解,ICP-AES法测定了拟薄水铝石中Si,Fe,Na,K,Ca,Mg,Zn,Ti,V,P,Li等11种微量和痕量杂质元素含量。样品用王水溶解,在200℃密闭消解30 min,冷却定容后进行测定。用各元素标准溶液绘制校准曲线,用高纯铝基体匹配校正基体效应。在选定的仪器工作条件下,11种被测杂质元素的检出限范围0.0024~0.42μg/m L,当杂质元素含量大于0.001%时,本法测定值与XRF法和AAS法的测定值相符,不同元素测定值的相对标准偏差(n=10)在0.70%~4.8%之间。 Eleven trace and trace impurity elements such as Si, Fe, Na, K, Ca, Mg, Zn, Ti, V, P and Li were determined by microwave digestion and ICP-AES. Samples were dissolved with aqua regia, digestion and digestion at 200 ℃ for 30 min, after cooling to determine the volume. The calibration curve is plotted with standard solutions of each element and the matrix effect is corrected with a high-purity aluminum matrix. The detection limits of the eleven tested impurity elements ranged from 0.0024 to 0.42 μg / m L at selected instrument operating conditions. When the impurity element content is greater than 0.001%, the measured values ​​of this method and those measured by XRF and AAS The relative standard deviations (n ​​= 10) of the measured values ​​for different elements ranged from 0.70% to 4.8%.