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作为电子封装工业用引线框架主要材料之一的ＦｅＮｉ４２合金应当具有良好的应用性能。本工作研究了微量添加元素Ｚｒ对ＦｅＮｉ４２合金再结晶及晶粒长大的影响。结果表明，Ｚｒ元素可以明显地提高合金的再结晶温度，并能有效地抑制合金再结晶后的晶粒长大。此外，腐蚀实验的结果表明，Ｚｒ元素的加入可以改善合金腐蚀后的表面粗糙度，这将有利于蚀刻法生产所获得的ＦｅＮｉ４２合金引线框架的质量。利用本工作所研究的含ＺｒＦｅＮｉ４２合金已制作出３０４ｐｉｎ引线框架
FeNi42 alloy which is one of the main materials of electronic package industrial lead frame should have good application performance. This work studied the effect of trace addition of Zr on the recrystallization and grain growth of FeNi42 alloy. The results show that Zr can significantly increase the recrystallization temperature of the alloy and effectively suppress the grain growth after recrystallization. In addition, the results of the corrosion test show that the addition of Zr element can improve the surface roughness of the alloy after corrosion, which is beneficial to the quality of the FeNi42 alloy lead frame obtained by the etching method. The use of this work has been studied with ZrFeNi42 alloy has been produced 304pin lead frame