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针对工业过程常规PID控制回路普遍存在性能退化的现状,提出了1种基于双层结构的PID控制器性能评估方法,该方法可综合地评估PID控制器的性能。其中第1层次的评估只需最少量的过程信息,即采用最小方差基准和脉冲响应曲线方法对PID控制器的随机性性能和确定性性能两方面给出初步的评估。第2层次是基于PID结构的控制器性能评估,这个层次的评估更符合生产实际,但需要用到更多的过程知识和信息。最后将所提出的方法分别应用于仿真过程和工业实际过程。
Aiming at the current performance degradation of conventional PID control loop in industrial process, a method of evaluating the performance of PID controller based on two-layer structure is proposed. The method can evaluate the performance of PID controller synthetically. The first level of assessment requires only a minimal amount of process information, ie a minimum variance benchmark and an impulse response curve approach to give a preliminary assessment of both the stochastic and deterministic performance of the PID controller. The second level is based on PID structure controller performance evaluation, this level of assessment is more in line with the actual production, but need to use more process knowledge and information. Finally, the proposed method is applied to the simulation process and industrial actual process respectively.