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在激光二极管阵列泵浦高可靠固体激光器的研制和应用中,激光二极管阵列的寿命至关重要。通过搭建不完全匹配吸收固体激光寿命实时监测系统,实现了800nm激光二极管阵列的寿命测试。实验对固体激光系统输出能量的下降率、激光二极管阵列损毁程度以及激光二极管阵列的功率下降率进行比较分析,同时对比讨论了同批次阵列在常规测试条件下的寿命测试结果。结果表明:该固体激光系统在1.03×108个脉冲输出后激光二极管阵列的老化效果与同批阵列常规测试下在1.52×108脉冲输出后的老化效果相当,验证了该系统用于评价激光二极管阵列寿命的可行性。最后,基于半导体激光器的退化机理,结合光线追迹软件的模拟结果,讨论了不完全匹配吸收方法在寿命测试过程中的加速作用。
In the development and application of laser diode array pump highly reliable solid-state lasers, the lifetime of the laser diode array is of crucial importance. By setting up an imperfect matching real-time monitoring system for absorbing solid-state laser lifetime, the lifetime test of the 800nm laser diode array is realized. Experiments were conducted to compare the declining rate of the output energy of the solid-state laser system, the damage degree of the laser diode array and the power drop rate of the laser diode array. The life-span test results of the same batch array under the conventional test conditions are also compared. The results show that the aging of the laser diode array after 1.03 × 108 pulses output is equivalent to the aging effect of the 1.52 × 108 pulses output of conventional solid-state laser array. The system is validated to evaluate the laser diode array Feasibility of life expectancy. Finally, based on the degradation mechanism of semiconductor laser, combined with the simulation results of ray tracing software, the accelerating effect of the incomplete matching absorption method on the life testing process is discussed.