透射电镜(TEM)具有高的分辨率,能够在晶格尺度量级上直接观察材料的内部结构,能方便地研究材料内部的相组成和分布以及晶体中的位错、层错、晶界等,能同时进行材料晶体结构的电子衍射分析,它已成为研究材料微观组织结构最有力的工具。电子的散 Transmission electron microscopy (TEM) has high resolution, allowing direct observation of the material’s internal structure at the scale of the lattice scale, facilitating studies of phase composition and distribution within the material as well as dislocations, stacking faults, grain boundaries, etc. in the crystal , Which enables simultaneous electron diffraction analysis of the material’s crystal structure, has become the most powerful tool for studying the microstructure of materials. Electronic scattered