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现在小卫星所采用的功能强大的微型电路几乎控制了卫星的方方面面。尽管这些微型器件的功能强大,但很容易受到重离子引起的单粒子翻转(SEU)的破坏。现在的工艺生产的器件对SEU不是很敏感。当航天器向更小、更轻的结构发展时微型器件也朝着功耗更低、速度更快的方向发展。以上发展趋势伴随着大量太阳耀斑引起的更严重的重离子流将导致未来的微型器件每天都要经历100次的SEU!为了确保任务的成功,这些小卫星必须考虑采用一种或多种SEU缓解技术。
The powerful microcircuits used by small satellites now control almost every aspect of the satellite. Despite the power of these miniature devices, they are vulnerable to heavy ion-induced single-particle turnover (SEU) damage. Devices manufactured today are not very sensitive to SEU. As spacecraft move toward smaller and lighter structures, microdevices are also moving toward lower power and faster speeds. The above trend is accompanied by a heavier heavy ion flux caused by a large number of solar flares that will cause future miniature devices to experience 100 SEU daily! To ensure mission success, these satellites must consider the use of one or more SEU mitigation technology.