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一、前言在集成电路的测试中,除了对每个器件进行直流参数和功能测试之外,对于动态参数测试,虽然在器件制造工艺上可加以保证,以使该项参数测试简化为抽样测试。但在某种新品在试制阶段或小批量生产阶段,还需要对器件的动态参数进行一定数量的摸底测试。不管怎样,都存在着如何测试其动态参数的问题。目前国内各生产集成电路的厂家采用各种不同的方法如:采样法、选通法、环形振荡器法、示波器直读法等对器件进行动态参数的测试。这
I. INTRODUCTION In the testing of integrated circuits, in addition to the DC parameters and functional tests for each device, the dynamic parameter test can be simplified in the device manufacturing process to simplify the parameter test to sampling test. However, some new products in the trial stage or small batch production stage, the dynamic parameters of the device also need a certain amount of thoroughly test. Anyway, there is a problem of how to test its dynamic parameters. At present, the manufacturers of various integrated circuits in China use various methods such as sampling method, gating method, ring oscillator method, direct reading method of oscilloscope, etc. to test the dynamic parameters of the device. This