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首先分析了光线通过薄膜的理论及特点,在此基础上,采用透镜、分束棱镜、滤光片以及新型半导体光电位置敏感器件,设计了一种新型透明体厚度光电检测仪。该仪器中的光学系统设计,采用双光路消漂移方法,消除了光束的漂移等不稳定因素;信号处理电路采用高精度、低温漂放大器等元器件,最大程度地消除了热噪声;对入射光线、被测体、探测器三者之间的相对位置进行了最优化设计。最后,对该仪器的结构、特点以及产生的误差进行了分析,给出了几个重要结论。
First of all, the theory and characteristics of light passing through the film are analyzed. Based on this, a new type of transparent body thickness photodetector is designed by using lens, beam splitting prism, optical filter and novel semiconductor photoelectric position sensitive device. The optical system design of the instrument uses double optical path elimination drift method to eliminate instability factors such as drift of the light beam. The signal processing circuit uses components such as high precision and low temperature drift amplifiers to eliminate thermal noise to the maximum extent. , The measured body, the detector between the relative position of the three optimized design. Finally, the structure, characteristics and errors of the instrument are analyzed, and several important conclusions are given.