TeOx-SiO2 composite films having third-order nonlinearities were prepared by electrochemically induced sol-gel deposition method on ITO substrate. The third-order optical nonlinearities of the films were measured by Z-scan technique. The third-order nonlinear susceptibilities (x(3)) of the as-prepared films are 5.9 x 10-7 to 4.29 x 10-6 esu. The surface morphology and composition of the films were characterized by SEM/EDX, which identified that Te metallic particles well dispersed in TeOx-SiO2 gel films.