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在半导体激光端面抽运工作条件下,激光晶体会产生剧烈的热透镜效应。利用532nm激光作为探测光,观测探测光束通过晶体后的远场图像可以很好地评估热透镜效应程度大小。利用现有的热透镜理论结果建立了光束干涉模型,对远场光环现象进行了解释,并且分析得到了基于远场光环的热焦距计算公式。使用谐振腔稳定性法测量了热透镜焦距,并将测量结果与基于远场光环的热焦距计算结果作对比,验证了光线干涉模型的合理性及计算热焦距公式的准确性。
In the semiconductor laser end pumping operation, the laser crystal will produce a dramatic thermal lens effect. Using 532nm laser as the probe light, observing the far-field image of the probe beam after passing through the crystal can well evaluate the extent of thermal lens effect. The existing theory of thermal lens was used to establish the interference model of the light beam. The phenomenon of the far-field halo was explained, and the thermal focal length calculation formula based on the far-field ring was analyzed. The focal length of the thermal lens is measured by using the resonator stability method. Compared with the calculation results based on the thermal focal length of the far-field ring, the rationality of the light interference model is verified and the accuracy of calculating the thermal focal length formula is verified.