近来一种基于检测康普顿背散射辐射的新的简单的背散射成象系统问世。它优于现行的穿透系统:具有实时三维成象能力,即使对低原子序数材料仍有高衬度与背散射成象几何结构。结果表明,该系统可能用于现代产品中日益重要的轻合金、层压件与塑料的检测。 Recently a new simple backscatter imaging system based on the detection of Compton backscattered radiation was introduced. It is superior to the current penetration system: with real-time three-dimensional imaging capabilities, high contrast and backscattered imaging geometry even for low atomic number materials. The results show that the system may be used for the detection of increasingly important light alloys, laminates and plastics in modern products.