一、前言本文介绍一种利用全息干涉仪测量材料表面粗度的方法。文章阐述了理论和实验性的测量方法,这种方法适用于一个较广的表面粗度范围。这个理论仅仅在较小信号的情况下是有效的,在这种情况下的表面粗度是小于用来进行全息摄影的激光波长。但是,这只是对表面粗度范围的一个实际的限制, I. Preface This article describes a holographic interferometer used to measure the surface roughness of the material. The article expounds the theoretical and experimental measurement methods, which apply to a wide range of surface roughness. This theory is valid only with small signals, in which case the surface roughness is less than the laser wavelength used for holography. However, this is only a practical limit to the range of surface roughness,