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本文介绍微处理器功能测试系统MFTS的总体结构和工作原理,该系统采用一种无故障模型,测试序列灵活多变,因而故障覆盖率也是可变的,非确定性功能测试方法。
This article describes the overall structure and working principle of the Microprocessor Functional Test System (MFTS). The system uses a fault-free model with flexible test sequences, so fault coverage is also a variable, nondeterministic functional test method.