Ce-Zr compounds such as Ce0.68Zr0.32O2 solid solution, Ce/Zr nitrate and CeO2/ZrO2 were added into γ-alumina-based slurries, which were then loaded on FeCrAl f
Optical microscopy (OM) and transmission electron microscopy (TEM) were used to investigate the effect of tempering temperature on the experimental extra-high c
Tungsten-doped indium oxide (IWO) thin films were deposited on glass substrate by DC reactive magnetron sputtering. The effects of sputtering power and growth t