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1 目的 本方法规定了用于微电路整批筛选的筛选程序,以期达到与预定用途相适应的质量和可靠性水平。本方法必须与规定了微电路的设计、材料、性能、控制以及文件资料要求的其它文件,例如:MIL-M-38510或适用的器件规范配套使用以确保器件达到规定的质量和可靠性水平。鉴于筛选等级直接影响产品成本以及质量和可靠性,因此本方法给出了与两个器件等级或产品保证等级相对应的两个标准的筛选等级。因为不可能由一个特定的筛选等级得出一个绝对的质量与可靠性水平,也不可能得出一个精确的预期应用中的失效成本,所以两个筛选等级的选择是任意的。本方法允许灵活地选用筛选的条件和应力水平,以便用户可以根据自己的经验,特定针对的资源、产品或用途对筛选作
1 PURPOSE This method specifies a screening program for batch screening of microcircuits with a view to achieving quality and reliability appropriate for the intended use. This method must be used in conjunction with other documents that specify the design, material, performance, control, and documentation requirements of the microcircuit, such as MIL-M-38510 or applicable device specifications to ensure that the device achieves the specified level of quality and reliability. Since the screening level has a direct impact on product cost and quality and reliability, this method gives two standard screening levels that correspond to two device levels or product assurance levels. Because it is not possible to derive an absolute level of quality and reliability from a particular screening level, it is impossible to derive the failure cost of an accurate intended application, so the choice of two screening levels is arbitrary. This method allows flexibility in the selection of conditions and stress levels for screening so that users can screen based on their experience, specific resources, products or uses