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本文在分析实验结果的基础上,给出了一个掺杂程度与峰值电压间的经验关系.文中有关再结晶层浓度的数据是通过温差电动势率的测量而得到的.
Based on the analysis of the experimental results, an empirical relationship between the doping level and the peak voltage is presented in this paper. The data on the recrystallized layer concentration are obtained by measuring the temperature difference emf.