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X射线荧光光谱象其它分析技术一样也存在着元素间的相互影响(基体效应)。人们在理论研究和实验的基础上,提出了多种克服基体效应的数学模式。其中应用最广的是以所谓Lachance方程Wi/Ri=1+∑a_(ii)W_i (1)为代表的一类方程。式中的影响系数a多数是使用标样从实验中求出,故此称之为经验系数法,有的是用二元标样作图求出,也有的如Willy K.de Jongh从基本的理论公式出发考虑x光管的光谱分布用大型计算机算出相对强度R_i进而算出所谓理论a系数。但是这
As with other analytical techniques, X-ray fluorescence spectroscopy also has interplay of elements (matrix effect). On the basis of theoretical research and experiments, many kinds of mathematical models for overcoming matrix effects have been proposed. One of the most widely used is a class of equations represented by the so-called Lachance equation Wi / Ri = 1 + Σa_ (ii) W_i (1). In the formula, most of the influence coefficients a are obtained from experiments by using standard samples, so it is called empirical coefficient method. Some are obtained by using binary standard samples. Some examples are Willy K.de Jongh starting from the basic theoretical formula Considering the spectral distribution of the x-ray tube, the relative intensity R_i is calculated by a large computer to calculate the so-called theoretical a-coefficient. But this