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一、引言表面粗糙度的质量不仅影响生产时间、生产成本,而且影响整个产品的合格性和使用性能。目前,对表面粗糙度的评定和分析仅限于国标(GB 3035-83)中规定的参数,这些参数只能反映表面轮廓中相互独立的信息,对相关信息无能为力。从信号分析的观点来看,信号中所有相关信息都不能归咎为某一参数。因此,仅凭某几项参数来反映表面微观特征是不完善的,比如在高度参数R_a、R_z值完全相同的两个表面上,其微观不平度的形状可能是截然不同的,它们之间的不同只有通过谱分析才能反映出。另一方面,某些参数(如S、S_m)在图l所示的情况下是不易评定的。本文的主要目的就是想探讨一下表面粗糙度的合理分析
I. Introduction The quality of surface roughness not only affects the production time, production costs, but also affect the entire product’s eligibility and performance. At present, the assessment and analysis of surface roughness is limited to the parameters specified in the national standard (GB 3035-83). These parameters only reflect the independent information in the surface profile and can not help the related information. From the point of view of signal analysis, all relevant information in the signal can not be attributed to a certain parameter. Therefore, it is imperfect to reflect the surface micro-features by just a few parameters. For example, on the two surfaces with the same height parameters R_a and R_z, the shapes of the micro-irregularities may be completely different. Differences can only be reflected by spectral analysis. On the other hand, some parameters (such as S, S_m) are not easy to assess in the situation shown in Figure l. The main purpose of this paper is to explore a reasonable analysis of surface roughness