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自从１９８６年发明原子力显微镜（ＡＦＭ）以来，ＡＦＭ已经发展成为应用最为广泛的扫描探针显微镜［１］，它给材料科学家、化学家和生物学家提供了一个极为便利的研究手段．目前，原子力显微镜的空间分辨率已经达到原子尺度，同时又具有非常高的力的敏感性，可以探测１...
Since the invention of the Atomic Force Microscope (AFM) in 1986, AFM has evolved into the most widely used scanning probe microscope [1], providing material scientists, chemists and biologists with an extremely convenient means of research. At present, the atomic resolution of atomic force microscope has reached the atomic scale, at the same time it has a very high sensitivity of force, can detect 1 ...