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本文研究了微处理机各种辐射效应及失效模式,评述了各类微处理机目前的抗辐射水平。还讨论了其抗辐射加固途径和辐射损伤的退火。
In this paper, various radiation effects and failure modes of microprocessors are studied, and the current level of radiation resistance of various microprocessors is reviewed. Its anti-radiation reinforcement approach and radiation damage annealing are also discussed.