用机械共混或溶液共混的方法,制备了γ-射线辐照交联的聚甲基乙烯基硅氧烷(PDMVS)-聚乙烯(PE)合金膜,并用 XPS,SEM 和接触角测量等研究其表面结构。XPS 结果表明,在深度～5nm 的膜表面有 PDMVS 链段的富集(只有一个例外),并得到接触角测量的支持。研究结果也表明,即使在～5nm 范围的表面有 PE 链段的富集,其最外层也存在一层很薄(～单分子层)的PDMVS,这一薄层就决定了接触角,并对膜功能有大的影响。 Γ-ray cross-linked polymethylvinylsiloxane (PDMVS) -polyethylene (PE) alloy films were prepared by mechanical blending or solution blending and were characterized by XPS, SEM and contact angle measurement Study its surface structure. The XPS results show the enrichment of the PDMVS segment at the depth of ~ 5 nm (with one exception) and support for contact angle measurements. The results also show that there is a very thin (~ monolayer) PDMVS in the outermost layer, even with a PE segment enrichment on the ~ 5 nm surface, which determines the contact angle and Membrane function has a big impact.