目前,在X射线探伤中,对X射线探伤机性能的掌握,透照规范的选择,都需要针对每台设备的具体情况进行试验,从而找出理想的透照参数,制定合理的规范。选取透照规范一般按曝光曲线;我们常用的曝光曲线一般有两种:一种是依据一定的透照电压,给出曝光量与透照厚度的关系;另一种则是对于一定的曝 At present, X-ray flaw detection, X-ray flaw detection machine performance control, specification of transparent specifications, we need to test the specific circumstances of each device to find the ideal parameters of the transillumination, to develop a reasonable standard. Select the general specifications according to exposure specifications exposure curve; we commonly used exposure curves are generally two: one is based on a certain voltage through the exposure, given the relationship between exposure and thickness of the transillumination; the other is for a certain exposure