X线头影测量技术自 1931年由Broadbent开创以来 ,便成为研究颅面生长发育、牙颌畸形机理的重要手段 ,在正畸与正颌外科临床与科研中一直具有重要作用。其历史发展可分为3个阶段 :(1)手工描点与测量阶段 ;(2 )计算机辅助测量分析阶段 ;(3)全自动X线头影测量分析系统阶段。下面就 X-cephalometry has been an important method to study the mechanism of craniofacial growth and dento-mandibular deformity since it was pioneered by Broadbent in 1931. X-ray cephalometry has always played an important role in the clinical and scientific research of orthodontics and orthognathic surgery. Its historical development can be divided into three stages: (1) hand-painted point and measurement phase; (2) computer-aided measurement and analysis phase; (3) automatic X-cephalometry measurement and analysis system stage. Below