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集成电路参数成品率的研究是集成电路可制造性工程和设计研究的重要内容之一。作者首先给出了参数成品率的计算模型 ;其次讨论了模拟参数成品率的原理和算法 ;最后给出了参数成品率的优化模型和求解方法。
The research on the yield of integrated circuit parameters is one of the important contents in the research of manufacturability engineering and design of integrated circuits. The author first gives the calculation model of the parameter yield; secondly, it discusses the principle and algorithm of the simulation parameter yield; finally, it gives the optimization model and the solution method of the parameter yield.